Bickmore et al.
 Geological Materials Research
 v.1, n.5
Measuring Discrete Feature Dimensions in AFM Images with Image SXM 

Barry R. Bickmore1, Eric Rufe1, Steve Barrett2,
and Michael F. Hochella, Jr.1

1Department of Geological Sciences, 4044 Derring Hall, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061 USA
2Surface Science Research Centre, University of Liverpool, Liverpool L69 3BX, United Kingdom
(Received August 2, 1999; Published November 23, 1999)


A suite of macros for the freeware image analysis program, Image SXM, are described. These macros are designed to measure the perimeter, horizontal area, and volume of discrete features in AFM images, obtaining accurate and consistent estimates. Directions for using the software and example applications are also given. Such tools allow one to perform tasks which would otherwise be extremely tedious or next to impossible. Examples include calculating reaction rates from time-series images of reacting particles or etch pits with complex shapes, and classifying objects based on their dimensions.

Keywords: Atomic Force Microscopy, image analysis, perimeter, area, volume, Image SXM

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Copyright ©1999 by the Mineralogical Society of America