data_melanophlogite _audit_creation_method SHELXL-97 _chemical_name_systematic ; ? ; _chemical_name_common ? _chemical_melting_point ? _chemical_formula_moiety ? _chemical_formula_sum 'C0.17 O2 Si' _chemical_formula_weight 62.18 loop_ _atom_type_symbol _atom_type_description _atom_type_scat_dispersion_real _atom_type_scat_dispersion_imag _atom_type_scat_source 'O' 'O' 0.0106 0.0060 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'Si' 'Si' 0.0817 0.0704 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' 'C' 'C' 0.0033 0.0016 'International Tables Vol C Tables 4.2.6.8 and 6.1.1.4' _symmetry_cell_setting 'cubic' _symmetry_space_group_name_H-M 'P m -3 n' loop_ _symmetry_equiv_pos_as_xyz 'x, y, z' 'x, -y, -z' '-x, -y, z' '-x, y, -z' '-y+1/2, x+1/2, z+1/2' 'y+1/2, x+1/2, -z+1/2' 'y+1/2, -x+1/2, z+1/2' '-y+1/2, -x+1/2, -z+1/2' 'y, z, x' '-y, -z, x' 'y, -z, -x' '-y, z, -x' '-z+1/2, y+1/2, x+1/2' '-z+1/2, -y+1/2, -x+1/2' 'z+1/2, -y+1/2, x+1/2' 'z+1/2, y+1/2, -x+1/2' 'z, x, y' '-z, x, -y' '-z, -x, y' 'z, -x, -y' '-x+1/2, -z+1/2, -y+1/2' '-x+1/2, z+1/2, y+1/2' 'x+1/2, -z+1/2, y+1/2' 'x+1/2, z+1/2, -y+1/2' '-x, -y, -z' '-x, y, z' 'x, y, -z' 'x, -y, z' 'y-1/2, -x-1/2, -z-1/2' '-y-1/2, -x-1/2, z-1/2' '-y-1/2, x-1/2, -z-1/2' 'y-1/2, x-1/2, z-1/2' '-y, -z, -x' 'y, z, -x' '-y, z, x' 'y, -z, x' 'z-1/2, -y-1/2, -x-1/2' 'z-1/2, y-1/2, x-1/2' '-z-1/2, y-1/2, -x-1/2' '-z-1/2, -y-1/2, x-1/2' '-z, -x, -y' 'z, -x, y' 'z, x, -y' '-z, x, y' 'x-1/2, z-1/2, y-1/2' 'x-1/2, -z-1/2, -y-1/2' '-x-1/2, z-1/2, -y-1/2' '-x-1/2, -z-1/2, y-1/2' _cell_length_a 13.399(2) _cell_length_b 13.399(2) _cell_length_c 13.399(2) _cell_angle_alpha 90.00 _cell_angle_beta 90.00 _cell_angle_gamma 90.00 _cell_volume 2405.6(7) _cell_formula_units_Z 46 _cell_measurement_temperature 293 _cell_measurement_reflns_used 3000 _cell_measurement_theta_min 5 _cell_measurement_theta_max 28 _exptl_crystal_description cubic _exptl_crystal_colour colourless _exptl_crystal_size_max 0.25 _exptl_crystal_size_mid 0.25 _exptl_crystal_size_min 0.25 _exptl_crystal_density_meas ? _exptl_crystal_density_diffrn 1.974 _exptl_crystal_density_method 'not measured' _exptl_crystal_F_000 1428 _exptl_absorpt_coefficient_mu 0.721 _exptl_absorpt_correction_type none _exptl_special_details ; ? ; _diffrn_ambient_temperature 293(2) _diffrn_radiation_wavelength 0.71073 _diffrn_radiation_type MoK\a _diffrn_radiation_source 'fine-focus sealed tube' _diffrn_radiation_monochromator graphite _diffrn_measurement_device_type 'Smart CCD Brucker diffractometer' _diffrn_measurement_method 'profile data from area detector' _diffrn_detector_area_resol_mean ? _diffrn_standards_number 100 _diffrn_standards_interval_count ? _diffrn_standards_interval_time ? _diffrn_standards_decay_% 98 _diffrn_reflns_number 6317 _diffrn_reflns_av_R_equivalents 0.0000 _diffrn_reflns_av_sigmaI/netI 0.0381 _diffrn_reflns_limit_h_min -17 _diffrn_reflns_limit_h_max 17 _diffrn_reflns_limit_k_min -16 _diffrn_reflns_limit_k_max 12 _diffrn_reflns_limit_l_min -17 _diffrn_reflns_limit_l_max 7 _diffrn_reflns_theta_min 2.15 _diffrn_reflns_theta_max 28.47 _reflns_number_total 6317 _reflns_number_gt 4523 _reflns_threshold_expression >2sigma(I) _computing_data_collection ? _computing_cell_refinement ? _computing_data_reduction ? _computing_structure_solution ? _computing_structure_refinement 'SHELXL-97 (Sheldrick, 1997)' _computing_molecular_graphics ? _computing_publication_material ? _refine_special_details ; Refinement with redundant (i.e. not merged/unique) data set. Refinement of F^2^ against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F^2^, conventional R-factors R are based on F, with F set to zero for negative F^2^. The threshold expression of F^2^ > 2sigma(F^2^) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F^2^ are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. ; _refine_ls_structure_factor_coef Fsqd _refine_ls_matrix_type full _refine_ls_weighting_scheme calc _refine_ls_weighting_details 'calc w=1/[\s^2^(Fo^2^)+(0.0601P)^2^+16.3830P] where P=(Fo^2^+2Fc^2^)/3' _atom_sites_solution_primary direct _atom_sites_solution_secondary difmap _atom_sites_solution_hydrogens . _refine_ls_hydrogen_treatment . _refine_ls_extinction_method none _refine_ls_extinction_coef ? _refine_ls_number_reflns 6317 _refine_ls_number_parameters 38 _refine_ls_number_restraints 0 _refine_ls_R_factor_all 0.0868 _refine_ls_R_factor_gt 0.0635 _refine_ls_wR_factor_ref 0.1525 _refine_ls_wR_factor_gt 0.1410 _refine_ls_goodness_of_fit_ref 0.916 _refine_ls_restrained_S_all 0.916 _refine_ls_shift/su_max 0.000 _refine_ls_shift/su_mean 0.000 loop_ _atom_site_label _atom_site_type_symbol _atom_site_fract_x _atom_site_fract_y _atom_site_fract_z _atom_site_U_iso_or_equiv _atom_site_adp_type _atom_site_occupancy _atom_site_symmetry_multiplicity Si1 Si 0.0000 0.31068 0.11429 0.03395 Uani 1 2 Si2 Si 0.18260 0.18260 0.18260 0.03132 Uani 1 3 Si3 Si 0.2500 0.0000 0.5000 0.0218 Uani 1 8 O1 O 0.09612 0.24655 0.13558 0.0726 Uani 1 1 O2 O 0.0000 0.40624 0.18129 0.0891 Uani 1 2 O3 O 0.34376 0.0000 0.0000 0.0410 Uani 1 4 O4 O 0.2500 0.2500 0.2500 0.0914 Uani 1 6 C1 C 0.0000 0.0000 0.0000 0.088 Uani 1.21 24 C2 C 0.5000 0.0000 0.2500 0.311 Uani 1.56 8 loop_ _atom_site_aniso_label _atom_site_aniso_U_11 _atom_site_aniso_U_22 _atom_site_aniso_U_33 _atom_site_aniso_U_23 _atom_site_aniso_U_13 _atom_site_aniso_U_12 Si1 0.0430 0.0249 0.0339 -0.0071 0.000 0.000 Si2 0.03132 0.03132 0.03132 -0.00513 -0.00513 -0.00513 Si3 0.0177 0.0239 0.0239 0.000 0.000 0.000 O1 0.0642 0.0852 0.0684 0.0122 -0.0109 0.0325 O2 0.169 0.0391 0.0590 -0.0308 0.000 0.000 O3 0.0340 0.0381 0.0510 0.000 0.000 0.000 O4 0.0914 0.0914 0.0914 -0.0373 -0.0373 -0.0373 C1 0.088 0.088 0.088 0.000 0.000 0.000 C2 0.387 0.387 0.158 0.000 0.000 0.000 _geom_special_details ; All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes. ; _geom_bond_atom_site_label_1 Si1 _geom_angle_atom_site_label_2 O1 _geom_bond_distance 1.5759 _diffrn_measured_fraction_theta_max 0.974 _diffrn_reflns_theta_full 28.47 _diffrn_measured_fraction_theta_full 0.974 _refine_diff_density_max 0.568 _refine_diff_density_min -0.368 _refine_diff_density_rms 0.087 _publ_section_exptl_refinement 'C1 and C2 ref. as C and higher than 1 to estimate the electron occupancy.' _publ_contact_author_name 'Mario Tribaudino' _publ_contact_author_address 'Dipartimento di Scienze della Terra' _publ_contact_author_email 'mario.tribaudino@unipr.it' _publ_contact_author_fax '00390521905340' _publ_contact_author_phone '00390521905340' _publ_section_abstract 'English' _publ_requested_journal 'American Mineralogist'